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VLSI Test Principles And Architectures: Design For Testability (The Morgan Kaufmann Series In Systems On Silicon)

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.· Lecture slides and exercise solutions for all chapters are now available.· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

Series: The Morgan Kaufmann Series in Systems on Silicon

Hardcover: 808 pages

Publisher: Morgan Kaufmann; 1 edition (July 21, 2006)

Language: English

ISBN-10: 0123705975

ISBN-13: 978-0123705976

Product Dimensions: 2 x 7.5 x 9.2 inches

Shipping Weight: 4 pounds (View shipping rates and policies)

Average Customer Review: 5.0 out of 5 stars  See all reviews (3 customer reviews)

Best Sellers Rank: #935,844 in Books (See Top 100 in Books) #44 in Books > Engineering & Transportation > Engineering > Electrical & Electronics > Circuits > VLSI & ULSI #126 in Books > Engineering & Transportation > Engineering > Electrical & Electronics > Circuits > Integrated #127 in Books > Computers & Technology > Hardware & DIY > Microprocessors & System Design > Computer Design

I have been reading this book for my new role as a DFT Engineer. I must say the concept in this book are very practical. I have been using this book as a reference book along side the requirements of the chip and it has been an invaluable resource.I will definitely recommend this book to anyone trying to understand DFT principles or use it as s refernce as part of DFT engineer role.Cheers...

I co-authored a chapter, so I am biased. But I use this book in my graduate test class. It is an excellent text for covering all of the fundamentals of integrated circuit testing - basic design-for-test, and algorithms for test generation and fault simulation.

This is a great book for Test/DFT engineers and EDA engineers developing test tool. It gives a thorough review of lot of concepts and techniques employed in practice which cannot be found if you look at a general testing book. This also makes it an excellent resource to prepare for interviews.

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